Quality control of semiconductor acid baths as per ASTM E1655 – Time- and cost-efficient with NIRS

In this white paper, Metrohm describes the capabilities of the modern analytical method near-infrared (NIR) spectroscopy for assessing the quality of acid baths for etching of microelectronics and printed electronics. Not only are analysis times sharply reduced to less than a minute, the related running costs are also significantly lower – certainly a boost in efficiency that should not be overlooked!