Quantitative mechanical property mapping at the nanoscale with PeakForce QNM

The scanning probe microscope (SPM) has long been recognized as a useful tool for measuring the mechanical properties of materials. Until recently though, it has been impossible to achieve truly quantitative material property mapping with the resolution and convenience demanded by SPM researchers. A number of recent SPM mode innovations have taken aim at these limitations, and now, with Bruker’s PeakForce QNM^®, it is possible to identify material variations unambiguously and at high resolution across a topographic image. In this application note, explore the principles and benefits of the PeakForce QNM imaging mode.