Reflectance Measurement of Thick Samples Using an Infrared Microscope

The AIM-9000 automated micro analysis system can normally measure samples with a thickness of up to approximately 10 mm by placing the sample on the stage. However, by removing the lower cassegrain (condenserobjective), samples with a thickness of up to 40 mm can be placed for reflectance and ATR measurement. This article introduces examples of reflectance measurement of samples with a thickness larger than 10 mm.