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Stabilizing the piezoresponse of rough ferroelectric materials

30 Jul 2020

In this white paper, Park Systems demonstrates dual-frequency resonance-tracking piezoresponse force microscopy (DFRT PFM) capabilities on the ferroelectric material bismuth ferrite (BFO) using a Park Systems NX20 AFM coupled with a Zurich Instruments HF2 lock-in amplifier (LIA).

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