Trace analysis using the inVia InSpect confocal Raman microscope

Raman spectroscopy is a non-contact, typically non-destructive analytical technique, meaning that samples can be reanalysed multiple times without damage or contamination. This product brochure from Renishaw details the features of the inVia™ InSpect, a new version of its bestselling inVia confocal Raman microscope, optimized for use in forensic laboratories for trace evidence analysis.