Search results for "rigaku"

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NEX OL Process Elemental Analyzer

Rigaku Corporation

On-line, real-time analysis by Energy Dispersive X-ray Fluorescence (EDXRF). Featuring advanced 3rd generation energy dispersive X-ray fluorescence (EDXRF) technology, the Rigaku NEX OL represents the next evolution of process elemental analysis for liquid stream and fixed position web or coil applications. Designed to span from heavy industrial through to food grade process gauging solutions, the NEX OL is configurable for u…

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HyPix-3000 2D Hybrid Pixel Array Detector

Rigaku Corporation

Rigaku’s HyPix-3000 is a next-generation two-dimensional semiconductor detector designed specifically to meet the needs of the home lab diffractionist. One of the HyPix-3000’s unique features is its large active area of approximately 3000 mm² with a small pixel size of 100 μm², resulting in a detector with high spatial resolution. In addition, the HyPix-3000 is a single photon counting X-ray detector with a high count rate of…

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MFM 310

Rigaku Corporation

The Rigaku MFM310 performs high-precision measurements not possible by optical or ultrasonic techniques. Perform thickness, density, roughness & composition of films on blanket and patterned wafers. This sophisticated X-ray metrology tool makes it practical to perform high-throughput measurements on product and blanket wafers ranging from ultrathin single-layer films to multilayer stacks.The MFM310 is designed with high-volum…

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RAPID II

Rigaku Corporation

A compact, fully integrated high-resolution, small molecule crystallography system, the Rigaku R-AXIS RAPID II is the latest member of the RAPID family of large-area curved imaging plate (IP) X-ray diffraction systems. The RAPID II combines every component needed for a high-performance X-ray diffraction system delivering no-compromise performance for applications ranging from applied crystallography to chemical crystallograph…

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FR-X Rotating Anode X-ray Source

Rigaku Corporation

The FR-X was designed to be utilized in structural biology and material science, and provides the highest usable X-ray flux available for the laboratory researcher.The new design provides 20% more flux compared to the previous model as well as a new direct-drive anode that reduces maintenance expense considerably. The standard dual port design can be coupled with an optional dual wavelength anode to provide the ultimate in exp…

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ZSX Primus III+

Rigaku Corporation

Rigaku ZSX Primus III+ delivers rapid quantitative determination of major and minor atomic elements, from oxygen (O) through uranium (U), in a wide variety of sample types — with minimal standards. ZSX Primus III+ features an innovative optics-above configuration. Never again worry about a contaminated beam path or down time due to sample chamber maintenance. The optics-above geometry eliminates cleaning worries and increases…

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nano3DX XRM

Rigaku Corporation

Rigaku nano3DX is a true X-ray microscope (XRM) with the ability to measure relatively large samples at high resolution. This is accomplished by using a high powered rotating anode X-ray source and a high-resolution CCD imager. The rotating anode provides for fast data acquisition and the ability to switch anode materials easily to optimize the data acquisition. AVAILABILITY: Japan, Austraila/NZ and North AmericaThe new nano3…

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WaferX 310

Rigaku Corporation

Rigaku's WaferX 310 represents the culmination of 35 years of experience in the X-ray fluorescence analysis of thin films on silicon wafers. The WaferX 310 is ideal for measuring BPSG, PSG and metal films. In addition, thin film BPSG, multilayered circuit film, WSix, electrode films, ferrodielectric thin films, FRAM, next generation DRAM, and SiOF are standard applications for this tool.Highly accurate analyses for the ultral…

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AZX 400 WDXRF

Rigaku Corporation

Rigaku's unique AZX 400 sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer was specifically designed to handle very large and/or heavy samples. Accepting samples up to 400 mm diameter, 50 mm thick and 30 kg weight, this system is ideal for analyzing sputtering targets, magnetic disks, or for multilayer film metrology or elemental analysis of large samples.Having the versatility to adapt to your specific…

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