How to prepare a TEM sample with ZEISS Crossbeam

In this video, learn how to prepare transmission electron microscopy (TEM) samples using ZEISS Crossbeam – a high-throughput focused ion beam scanning electron microscopy (FIB-SEM) tool for 3D analysis and sample preparation. The process includes navigating to the region of interest (ROI), preparing the sample, and conducting lift-out and thinning to obtain the desired sample thickness.