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ZEISS Sigma: Your FE-SEMs for High Quality Imaging and Advanced Analytical Microscopy

ZEISS Research Microscopy Solutions
4 Jun 2015
ZEISS Sigma: Your FE-SEMs for High Quality Imaging and Advanced Analytical Microscopy

The SIGMA series of Field Emission Scanning Electron Microscopes (FE-SEM) delivers advanced analytical microscopy with the high performance you expect from Carl Zeiss. Watch this video to learn more.

Other videos from ZEISS Research Microscopy Solutions

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