Characterization of optical layers using UV-Vis/NIR spectroscopy

The precise characterization of optical layers requires the measurement of the transmission or reflection at variable angles of incidence with the help of UV-Vis/NIR spectroscopy. It is important that both the half cone angle of the sample beam and the size of the measuring spot can be adjusted to the requirements of the sample. After a short introduction, these possibilities will be presented in this webinar with a live demo with the Agilent Cary UMS.

Key learning objectives

• General trends and challenges in optics and photonics
• Measurement systems for characterizing optical layers
• Live demo of a measurement of an edge filter
• Influences of the measurement parameters on the precision of the measurement results

Who should attend?

• Optical researchers
• QA/QC UV-Vis users
• Graduate students in optical research
• Manufacturers of thin-film optics

Certificate of attendance

All webinar participants can request a certificate of attendance, including a learning outcomes summary, for continuing education purposes.