Dual deconvolution of LC-PDA-MS data: A fast-track approach for chemical composition and impurity analysis

Now easily integratable into liquid chromatograph systems, mass spectrometry (MS) is increasingly recognized as an orthogonal detector that adds extra information to UV-based photodiode array (PDA) detectors. Analysis of chemical compositions and/or impurities is a typical application employing both PDA and MS detectors for enriching the information obtained from a single analysis.

One barrier to the adoption of MS detectors has been software to simplify the interpretation of PDA and MS data. Shimadzu’s compact LC-PDA-MS system operates on LabSolutions software, which is now equipped with deconvolution algorithms for both PDA and MS data. This webinar will reveal a streamlined workflow based on the dual deconvolution for resolving complexities caused by insufficient chromatographic separations. The approach is suited for both routine and research laboratories seeking to reduce time from samples to results.

Key learning objectives

  • Familiarize with Shimadzu’s new compact MS detector, LCMS-2050.
  • Learn how MS data helps spot co-eluting components and UV-transparent peaks.
  • Mass-it™ is a sophisticated algorithm that unravels complex MS data and labels key outcomes onto a UV chromatogram.
  • i-PDeA-II™ is a deconvolution algorithm for PDA that can resolve co-eluting impurities

Who should attend?

  • Managers, supervisors and senior lab technicians in research laboratories seeking to maximize the outcome of LC-PDA-MS analysis.
  • Lab managers in routine laboratories looking to reduce data analysis time.

Certificate of attendance

All webinar participants can request a certificate of attendance, including a learning outcomes summary, for continuing education purposes.

Speakers

Atsuhiko (Ash) Toyama
Atsuhiko (Ash) Toyama
Global Product Manager (LCMS), Shimadzu Corporation
Davide Vecchietti
Davide Vecchietti
Global Product Manager (LC), Shimadzu Corporation
Ellen Simms
Ellen Simms
Product and Reviews Editor, SelectScience

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