Recent FE-SEM developments for material characterization: Combining Gemini optics and image processing
Observing materials using a field emission scanning electron microscope (FE-SEM) has become essential for the development of materials. Production steps and even macroscopic properties are related to the microstructure of materials. Therefore, microscopy is the tool of choice, enabling material researchers to link micro- and nanometer-scaled structures and macro-scaled properties. Advances in usability have made this technology approachable for any kind of user, no matter if they are a novice or expert.
In this webinar, we will show how the FE-SEM combines the latest hardware and software technology in the analysis and characterization of various materials. The examples shown will cover research trends in nanotechnology, miniaturization of devices, life sciences, and novel materials.
Key learning objectives
- Discover the benefits of using Gemini optics for materials analysis
- Understand software-supported image analysis
- Learn how to analyze charging materials with the new NanoVP lite mode
- Explore examples of low kV imaging for challenging samples
Who should attend?
- Materials scientists
- Core facility managers of microscopy centers
- Scientists or research professionals in materials science, semiconductor/electronics, life sciences, academia, government or industry, PhD students, and researchers who are interested in microscopic characterizations
Certificate of attendance
All webinar participants can request a certificate of attendance, including a learning outcomes summary, for continuing education purposes.
Speakers
