Extend the Capabilities of Your TEM with a DENSsolutions In Situ TEM System

Starting January 2016, AXT will be distributing the complete range of DENSsolutions in situ TEM systems in Australia and New Zealand, further extending their comprehensive microscopy product portfolio. These exciting systems utilize the latest MEMS based technology effectively converting your conventional TEM from a static imaging system into a powerful multi-functional nano-laboratory.

DENSsolutions have been at the forefront of the in situ TEM microscopy field with their team developing in situ systems for more than 20 years. Their solutions enable the real-time study of sample dynamics under thermal, electrical, gas and liquid stimuli. Example applications areas include reaching elevated temperature > 1,300 °C in a stable and controlled environment to observe phase transformations or precipitation growth in real-time.

CLEM technologies have revolutionized optical and Scanning Electron Microscopy by allowing researchers to quickly and easily marry the two technologies together gaining additional information about their samples, including the additional analytical modes available in SEM such as EDS, cathodoluminescence etc. Similarly, adding additional modalities to your TEM enables you to greatly accelerate your research and speed up your workflow.

The in situ TEM systems allow you to apply heat, bias, gas and liquid to the sample environment. This enables you to observe how your specimens behave in the real-world working or native environment. These systems are suited to a range of applications from high temperature alloys, semiconductor materials for failure analysis and biological specimens kept in their native state.

All of these systems can be installed into existing TEMs, thus extending the capabilities of your current systems and increasing its analytical potential.