Latest Version of Software Package Provides Easily Defined Scanning Probe Experiment Parameters

19 Sept 2010
Sarah Sarah
Marketing / Sales

Uniscan Instruments announces the latest version of its multi-technique software package for the M370 scanning probe systems. The new version is available for the SECM, SVP, SDS, SKP and OSP scanning electrochemistry modules. Many additional features and functionality have been added to the package.

New configurations for area and line scan experiments provide easily defined experiment parameters. The inclusion of new definable parameters, including fuller and reworked pre-conditioning parameters for pre-conditioning the sample or probe, extend the capabilities of the systems. The addition of line delays allow for the relaxation of the sample or additional surface processes to take place and data acquisition in forward and reverse scans is now available for faster data acquisition.

Time evolution experiments are now possible and a special option to average data over multiple lines option reduces noise and increases the signal response ratio. There is now independent control over sweep, step and return speed which allow for a more flexible approach to the configuration of the experiment. New automated multi-zone SECM scanning/mapping gives consecutive area maps at different locations on the sample.

Dual potentiostat control is available with the SECM module which allows the system to monitor and record the electrochemical activity simultaneously at the probe and the substrate. Control over current ranging, range change delays and the ability to collect or not to collect data give greater flexibility to the way information is recorded.

New graphs and mapping functions have been added with the ability to analyse data within the program and remove the necessity to export data to an external package.

The latest version of software is shipping with all new systems and is available as a free update to existing customers and can be downloaded from the Uniscan Instruments website.

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