More Efficient Fault Detection for Solar Cells

Common faults in solar cells and panels can now be detected far more simply using two high-performance cameras from Andor Technology – the iKon-M 934 BR-DD and the LucaEM R.

Both cameras have high quantum detection efficiency and sensitivity in the near-infrared (NIR) range, making them ideal for solar cell quality control during manufacturing. They harness the phenomenon of induced photovoltaic electroluminescence, where weak emissions in the 900-1100nm wavelength range are used to detect typical faults such as shunts, crystalline defects and broken-finger electrodes.

These cameras also offer exceptionally high sensitivity at rapid frame rates, meaning they can be used for high-throughput testing of individual photovoltaic cells or larger panels.

By incorporating photovoltaic electroluminescence into their QC routines and R&D work, manufacturers can benefit from a simpler, potentially less expensive inspection technique. However, as photovoltaic electroluminescence emissions are very weak, extremely sensitive cameras are required, such as the iKon-M BR-DD and the LucaEM R.

The LucaEM R is a highly cost-effective yet fast and powerful Electron Multiplying CCD camera for high-throughput in-line production inspection. LucaEM R uses a monochrome megapixel frame-transfer EMCCD sensor, providing single photon detection sensitivity and high NIR quantum efficiency (27% @ 900 nm) in a cooled, compact, USB 2.0 camera platform.

The iKon-M 934 BRDD is designed to offer ultimate responsivity in the NIR region, delivering ~70% QE at 900nm. The megapixel CCD camera also benefits from deep TE cooling to -100 0C, very low read noise and a convenient USB 2.0 interface.

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