New Data Sheet Featuring NanoScope® IV SPM Controller Now Available.

Santa Barbara, CA, October 5, 2001 - Digital Instruments, Veeco Metrology Group announces the release of the new Data Sheet, “NanoScope IV SPM Controller: Gateway to the Future of SPM”. This Data Sheet reviews Faster scanning for increased productivity, OneScan™ Imaging, Quadrex™ Technology, AFM Prob Q-Control, Phase Detection Magnetic Force Microscopy (MFM), and Flexibility and Expandability of the NanoScope IV Controller.

The NanoScope IV improves conventional Scanning Probe Microscopy (SPM) and Atomic Force Microscopy (AFM) systems in every important aspect of operation - including up to 10 times faster scanning, up to one hundred times higher lateral data resolution on large scans, up to 10 times higher sensitivity, vastly improved accuracy of positioning, and expanded customizable measurement and analysis capabilities. These capabilities not only improve the productivity and results of surface analyses, but also provide an enabling platform for nanoscience and nanotechnology, including manipulation of materials and specimens at the nano-scale. In addition, the NanoScope IV is compatible with all existing Digital Instruments SPM/AFMs and is the fundamental component for next-generation Digital Instruments’ innovations.

To access this data sheet on-line, please visit www.di.com directly to either review or order printed copies under the 'Data Sheet' or 'Literature' menu’s.

Veeco Instruments Inc. is a worldwide leader in process equipment and metrology tools for the optical telecommunications, data storage, semiconductor and research markets. Manufacturing and engineering facilities are located in New York, California, Colorado, Arizona and Minnesota. Global sales and service offices are located throughout the United States, Europe, Japan and Asia Pacific. Additional information on Veeco can be found at www.veeco.com.