New Particle Analyzers Measure Both Zeta Potential and Submicron Size

1 Mar 2007

Beckman Coulter, Inc. previewed the Delsa??Nano Series Particle Analyzers at Pittcon 2007. The new instruments perform zeta potential and particle size analysis on the same sample. The systems are designed to deliver accurate size measurement on particles ranging from 0.6 nm to 7 ?m and to measure the zeta potential of concentrated material and solid flat surfaces such as films, paper and glass. It is ideal for any liquid application, including pharmaceuticals, water treatment, paints, paper and petrochemicals.

Beckman Coulter will offer four models in the series ??the DelsaNano S for particle size analysis, the DelsaNano Z for zeta potential, the DelsaNano C for both measurements and the DelsaNano HS high-sensitivity instrument for use with concentrated materials and films. An optional Auto Titrator is easily integrated for pH adjustment of the sample.

??e are pleased to offer our customers a single instrument with such flexibility and versatility,??commented Guillermo Smart, product manager for Beckman Coulter. ??n addition, all aspects of the system are easy to use.??Beckman Coulter expects to begin shipping the DelsaNano in the second quarter of this year.

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