ZEISS Atlas 5 – A New Approach to Master the Multi-Scale Challenge

ZEISS introduces an integrated solution to acquire and analyze multi-scale and multi-modal images in light, electron and X-ray microscopy

2 May 2016
Lois Manton-O'Byrne
Executive Editor

 

ZEISS Atlas 5 is a powerful hardware and software package that extends the capacity of ZEISS scanning electron microscopes (SEM) and focused ion beam SEMs (FIB-SEM). ZEISS Atlas 5 streamlines automatic image acquisition and lets users benefit from its efficient navigation and correlation of images from any source including light and X-ray microscopes.

Taking full advantage of high throughput and automated large area imaging, users acquire large sets of 2D or 3D nanoscale electron microscope (EM) images for hours, or even days, without operator supervision. Advanced preset and customizable protocols allow to produce consistent and reproducible results.

ZEISS Atlas 5 correlative workspace makes it easy to bring together images from multiple sources: zooming in from the full macroscopic view of the sample down to nanoscale details. The sample-centric workspace lets users build a seamless multi-modal, multi-scale picture of the sample.


 

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