FS-1 Multi-Wavelength Ellipsometer
Key Features Benefits Multiple LED sources: Blue (465nm), Green (525nm), Yellow (580nm), and Red (635nm) Long lifeti...
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Multi-Wavelength Ellipsometers for Thin Film Measurements
Innovative
The Film Sense FS‑1™ Multi-Wavelength Ellipsometer uses long-life LED’s and a no-moving-parts ellipsometric detector to provide fast and reliable thin film measurements in an easy-to-use, compact system.
Powerful
The film thickness of most transparent thin films from 0 – 1000 nm can be determined with excellent precision and accuracy by a simple 1 second measurement. Optical constants n & k and other film properties can also be measured for many samples.
Affordable
The FS‑1 offers the power of Multi-Wavelength Ellipsometry, but at the price point of single wavelength ellipsometer and spectroscopic reflectometer systems. The FS‑1 is ideal for measurements in the research lab, classroom, in situ process chambers, industrial quality control, and more.