VEECO Instruments Inc.

MultiMode 8 Scanning Probe Microscope from Veeco Instruments The World's Highest Resolution, Most Published SPM Just Got Better The MultiMode® 8 Scanning Probe Microscope (SPM) resets the standard for...

Silicon nitride probes for contact, fluid tapping mode and force measurement, with a variety of extremely low spring constants for high force sensitivity. Sharpened; 6 cantilevers 0.01-0.50N/m; Au Ref...

The Dektak® 8 Advanced Development Profiler combines high repeatability, low-force sensor technology, and advanced 3D data analysis for surface characterization of MEMS, semiconductors and other thin/...

The Dimension® Edge™ Atomic Force Microscope (AFM) System offers streamlined access to top AFM performance, representing a new level of productivity and attainability for the most advanced nanoscale r...

Lowest noise, highest resolution Atomic Force Microscope in its classThe Innova atomic force microscope provides more performance and flexibility at a greater value than any other SPM. The proprietary...