CLUE Series Cathodoluminescence Add-ons for Electron Microscopes
The CLUE (Cathodo-Luminescence Universal Extension) series is designed for use in materials science, mineralogy, geology, life sciences and forensics applications. They interface with any Scanning Electron Microscopes (SEM) and dual SEM/Focused Ion Beam (FIB) microscopes, are fully automated, modular for easy upgrade and offer the widest spectral range available (UV-Vis-IR).
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The CLUE (Cathodo-Luminescence Universal Extension) series is designed for use in materials science, mineralogy, geology, life sciences and forensics applications. They interface with any Scanning Electron Microscopes (SEM) and dual SEM/Focused Ion Beam (FIB) microscopes, are fully automated, modular for easy upgrade and offer the widest spectral range available (UV-Vis-IR).
