FilmTek SE
FilmTek SE automated benchtop spectroscopic ellipsometer enables highly precise, repeatable film thickness, refractive index, and extinction coefficient measurements on a range of thin and ultra-thin film samples. This budget-friendly ellipsometer is ideally suited for use in academic and R&D settings investigating the thickness and uniformity of ultra-thin films.
FilmTekSE spectroscopic ellipsometer
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Spectroscopic ellipsometer for thin film thickness and optical constant measurement.
The base model of our "SE" product line, the FilmTek SE automated benchtop spectroscopic ellipsometer offers users a streamlined option for quickly and easily collecting highly precise, repeatable measurements on a range of thin and ultra-thin film samples.
Enables simultaneous determination of:
- Multiple layer thicknesses
- Indices of refraction [ n(λ) ]
- Extinction (absorption) coefficients [ k(λ) ]
- Energy band gap [ Eg ]
Virtually all translucent films ranging in thickness from less than 100 Å to approximately 50 µm can be measured with high precision. Typical application areas include:
- Multilayer optical coatings
- Optical antireflection coatings
- Thin metals
- Solar cells
