HTK 1200N High-Temperature Oven Chamber
The HTK 1200N is an advanced high-temperature chamber with a robust design for in-situ X-ray diffraction studies in different atmospheres up to 1200 °C. Its environmental heater guarantees excellent uniformity of the sample temperature. Use the HTK 1200N for different types of in-situ X-ray investigations, including studies of phase transformations, structure determination, and studies of chemical reactions. Key features:…
HTK 1200N
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Great when it works but not very reliable.
Materials characterisation by X-ray powder diffraction
I have an Anton Paar HTK1200N high temperature stage on my PANalytical X'Pert X-ray powder diffractometer. When this instrument is working well it is excellent, I use it to determine a previously unknown phase transition. However, we have repeatedly had to send all or part of this equipment back to Austria for repair. The sample stage returned earlier this week but test scans showed that the temperature was not stable.
Review Date: 17 Dec 2020 | Anton Paar
The HTK 1200N is an advanced high-temperature chamber with a robust design for in-situ X-ray diffraction studies in different atmospheres up to 1200 °C. Its environmental heater guarantees excellent uniformity of the sample temperature. Use the HTK 1200N for different types of in-situ X-ray investigations, including studies of phase transformations, structure determination, and studies of chemical reactions.
Key features:
Precise temperature measurement and control
- Highly reliable temperature measurement right at the sample
- Excellent temperature uniformity in the sample
- Almost no restrictions on sample thickness
Sample spinning is crucial
- Sample spinning option for optimum data quality
- Sample carriers of various chemically resistant materials available
- Quick exchange of sample carriers for easy sample preparation
The ideal tool for a wide range of applications
- Robust and compact design using high quality materials
- Fits most available goniometers
- Available with automated motorized z-aligment stage for temperature-dependent sample realignment
