Products & ReviewSpectroscopy

iKon-M SY

Andor’s standalone USB 2.0 iKon-M SY 934 series features a high-QE, back-illuminated sensor for direct X-ray detection. A convenient Berylium foil window blocks visible wavelengths with minimal ‘Beam Hardening’ of X-ray energies giving a direct detection energy range from 20keV.This 1024 x 1024 sensor array with 13 x 13 μm pixels offers high dynamic range and high spatial resolution. Seamless software selection of a range of…

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Andor’s standalone USB 2.0 iKon-M SY 934 series features a high-QE, back-illuminated sensor for direct X-ray detection.

A convenient Berylium foil window blocks visible wavelengths with minimal ‘Beam Hardening’ of X-ray energies giving a direct detection energy range from < 2.5 keV to > 20keV.

This 1024 x 1024 sensor array with 13 x 13 μm pixels offers high dynamic range and high spatial resolution. Seamless software selection of a range of kHz and Multi-MHz readout speeds provide exceptionally low readout noise and faster frame rates respectively.

Variable readout rates enable data readout at up to 5 Megahertz, through the plug and play USB interface.

The camera maintains cooling options down to -100°C, resulting in negligible dark current and provides unrivalled performance for imaging applications. The camera comes with Andor’s UltraVac™ technology providing a worry free 5 year vacuum warranty as standard.


iKon-M SY Features:

  • UltraVac™ - 5 Year Warranty. Proprietary and proven vacuum process, critical for sustained vacuum integrity, sensor protection and unequalled cooling, year after year.
  • 'Standalone’ Be Window - 200 µm Berylium window as standard
  • 13 x 13 µm pixel size - Optimal balance of dynamic range and resolution
  • Ultra-low noise readout - Intelligent low-noise electronics offer the most ‘silent’ system noise available
  • Multi-Megahertz pixel readout - High frame rates achievable (5 MHz in visualization mode, 50 kHz for the highest sensitivity and signal-to-noise ratio)
  • USB 2.0 connection - USB plug and play – no controller box
  • Enhanced baseline clamp - Quantitative accuracy of dynamic measurements.
  • Cropped sensor mode - Specialized acquisition mode for continuous imaging with fast temporal resolution
  • Integrated in EPICS - Platform is fully integrated into the EPICS control software

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