iKon-M SY
Andor’s standalone USB 2.0 iKon-M SY 934 series features a high-QE, back-illuminated sensor for direct X-ray detection. A convenient Berylium foil window blocks visible wavelengths with minimal ‘Beam Hardening’ of X-ray energies giving a direct detection energy range from 20keV.This 1024 x 1024 sensor array with 13 x 13 μm pixels offers high dynamic range and high spatial resolution. Seamless software selection of a range of…
Andor’s standalone USB 2.0 iKon-M SY 934 series features a high-QE, back-illuminated sensor for direct X-ray detection.
A convenient Berylium foil window blocks visible wavelengths with minimal ‘Beam Hardening’ of X-ray energies giving a direct detection energy range from < 2.5 keV to > 20keV.
This 1024 x 1024 sensor array with 13 x 13 μm pixels offers high dynamic range and high spatial resolution. Seamless software selection of a range of kHz and Multi-MHz readout speeds provide exceptionally low readout noise and faster frame rates respectively.
Variable readout rates enable data readout at up to 5 Megahertz, through the plug and play USB interface.
The camera maintains cooling options down to -100°C, resulting in negligible dark current and provides unrivalled performance for imaging applications. The camera comes with Andor’s UltraVac™ technology providing a worry free 5 year vacuum warranty as standard.
iKon-M SY Features:
- UltraVac™ - 5 Year Warranty. Proprietary and proven vacuum process, critical for sustained vacuum integrity, sensor protection and unequalled cooling, year after year.
- 'Standalone’ Be Window - 200 µm Berylium window as standard
- 13 x 13 µm pixel size - Optimal balance of dynamic range and resolution
- Ultra-low noise readout - Intelligent low-noise electronics offer the most ‘silent’ system noise available
- Multi-Megahertz pixel readout - High frame rates achievable (5 MHz in visualization mode, 50 kHz for the highest sensitivity and signal-to-noise ratio)
- USB 2.0 connection - USB plug and play – no controller box
- Enhanced baseline clamp - Quantitative accuracy of dynamic measurements.
- Cropped sensor mode - Specialized acquisition mode for continuous imaging with fast temporal resolution
- Integrated in EPICS - Platform is fully integrated into the EPICS control software