NANOHUNTER II
Benchtop total reflection X-ray Fluorescence (TXRF) spectrometer
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The new, next generation Rigaku NANOHUNTER II benchtop total reflection X-ray fluorescence (TXRF) spectrometer enables high-sensitivity ultra-trace elemental analysis of liquids down to parts-per-billion (ppb) concentrations.
Total reflection X-ray fluorescence spectroscopy is a method by which an incident beam of X-rays just grazes the sample, delivering low-background noise, high-sensitivity measurement of ultra-trace elements.
Benchtop TXRF with 600 W X-ray tube power
Rigaku NANOHUNTER II TXRF analyzer combines a fully automatic optical axis adjustment system that provides stable high-sensitivity analysis in an easily handled benchtop form factor that allows quick and trouble-free operation. With a high-power 600 W X-ray source, a newly developed mirror (optic) and a large-area silicon drift detector (SDD), the NANOHUNTER II TXRF spectrometer features a 16 position autosampler to take advantage of fast measurement times for high throughput.
Key Features:
- Benchtop TXRF for ultra-trace analysis
- GI-XRF capability for thin film characterization
- Quantify to parts-per-billion (ppb) levels
- 600 W X-ray tube for fast measurements
- Silicon drift detector (SDD)
- 16 position autosampler
- High sensitivity for As, Se and Cd
- Perfect for nano-particle analysis
- Analysis environment: Air, N2*, or He*
*optional
