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Thermo Scientific™ Verios™ 5 XHR SEM
Thermo Fisher ScientificVERIOS5
Precise SEM characterization of nanomaterials with sub-nanometer resolution and high material contrast.
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The Verios 5 XHR SEM offers subnanometer resolution over the full 1 keV to 30 keV energy range with excellent materials contrast. Unprecedented levels of automation and ease-of-use make this performance accessible to users of any experience level.
Experience the advantages offered by the Verios XHR SEM:
- Best nanomaterial image resolution with UC+, a monochromated electron source for sub-nanometer performance from 1-30 kV
- Best contrast on sensitive materials with excellent performance down to 20 eV landing energy and high-sensitive in-column and below-the-lens detectors and signal filtering for low-dose operation and optimal contrast selection
- Shortest time to nanoscale information for users with any experience level using the best-in-class Elstar electron column featuring SmartAlign and FLASH technologies
- Consistent measurement results with ConstantPower Lenses, electrostatic scanning and a choice of two piezoelectric stages
- Flexibility for accessories with a large chamber
- Unattended SEM operation with AutoScript 4 Software, an optional Python-based application programming interface
