X-7600 SDD/LE EDRF Spectrometer
Xenemetrix Laboratory Energy Dispersive Fluorescent X-Ray (EDRF) spectrometers offer the ideal solution for non-destructive elemental analysis.
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Powerful and easy to use instrument
X-ray fluorescence
The x-7600 is powerful and easy to use. There are sometimes issues with signal peaks originating in the instrument, but the sensitivity is better than expected and measurements are quick and simple. I enjoy working with it.
Review Date: 26 Mar 2019 | Xenemetrix Ltd.
Xenemetrix Laboratory Energy Dispersive Fluorescent X-Ray (EDRF) spectrometers offer the ideal solution for non-destructive elemental analysis.
Silicon drift detector (SDD) simultaneously provides low electronic noise and high speed analysis, which translates into higher energy resolution and faster results compared to the Si-Pin and Si-Li detectors.
Eight secondary targets in X-7600 models provide maximum sensitivity for fast and accurate quantitative analysis even in complex matrices such as alloys, half-meters and geological samples. Fully customizable targets provide ppm detection limits for a wide range of elements.
Universal laboratory spectrometers can analyze liquids, solids, powders, extruded molds and air filters, and the analytical chamber allows you to place samples of various shapes and sizes.
The integral design of a 10/20 local automatic sample changer (auto sampler) ensures minimal human intervention and allows you to perform work in an automatic mode without the presence of an operator.
To achieve low detection limits, the fast, accurate and easy-to-use spectrometer is equipped with reliable hardware and powerful analytical software.
Multichannel shooting resolution provides excellent signal-to-noise ratio, which improves detector response.
- Nondestructive elemental analysis in the range from Carbon (6) or Ft ora (9) to Farm (100) in concentrations from tens of ppb and up to 100%
- The silicon drift detector (SDD) provides a very high analysis speed and an excellent energy resolution, which is suitable for elements with a high atomic number and for elements with a low atomic number
- SDD LE for more easy analysis of their elements.
- The patented WAG® X-ray optics technology (wide-ranging configuration) in response to a stimulus of up to 400 V t creates a powerful and fast-acting elemental analyzer that meets all the requirements of a research or production laboratory.
- Eight customizable filters and oem in toric targets ensure quick and accurate determination of major and residual elements.
- Workability provided by your own nEXt ™ software package
