Products & Reviews

Bruker’s large-sample Dimension IconIR system combines nanoscale infrared (IR) spectroscopy and scanning probe microscopy (SPM) on one platform to deliver the most advanced spectroscopy, imaging, and property mapping capabilities available for academic researchers and industrial users. Incorporating decades of research and technological innovation, IconIR provides unrivaled performance based on and building off the industry-b…

The ContourX-500 Optical Profilometer is the world’s most comprehensive automated benchtop system for fast, non-contact 3D surface metrology. The gage-capable ContourX-500 boasts unmatched Z-axis resolution and accuracy, and is easily customized for the widest range of complex applications, from QA/QC metrology of precision machined surfaces and semiconductor processes to R&D characterization for ophthalmics and MEMS devices.…

The Hysitron PI 89 SEM PicoIndenter leverages the advanced imaging capabilities of scanning electron microscopes (SEM, FIBSEM, PFIB), making it possible to perform quantitative nanomechanical testing while simultaneously imaging. Enabled testing techniques include nanoindentation, tensile testing, pillar compression, particle compression, cantilever bending, fracture, fatigue, dynamic testing, and mechanical properties mappin…

The Hysitron TI 980 nanoindenter achieves remarkable advances in control and throughput capabilities, testing flexibility, applicability, measurement reliability, and system modularity. This industry-leading system builds upon decades of Hysitron technological innovation to deliver new levels of extraordinary performance, enhanced capabilities, and ultimate versatility in nanomechanical characterization. 

Bruker’s Universal Mechanical Tester (UMT) platform has been the most versatile and widely used tribometer on the market since the first model debuted in 2000. Newly designed from the ground up, the UMT TriboLab has a unique modular concept that harnesses more functionality than ever before. In fact, the UMT TriboLab offers higher speeds, more torque, and better force measurement than any of its competitors, plus it introduce…

The DektakXT stylus profilometer features a revolutionary benchtop design that enables an unmatched repeatability of 4 Å and up to 40% improvement in scanning speeds. The technological breakthroughs incorporated in DektakXT enable critical nanometer-level surface measurements for the microelectronics, semiconductor, solar, high-brightness LED, medical, and materials science industries.

FilmTek SE automated benchtop spectroscopic ellipsometer enables highly precise, repeatable film thickness, refractive index, and extinction coefficient measurements on a range of thin and ultra-thin film samples. This budget-friendly ellipsometer is ideally suited for use in academic and R&D settings investigating the thickness and uniformity of ultra-thin films.

We offer a wide selection of AFM tips of various shapes, tip geometries, materials and coatings, spring constants, frequencies, etc. to fit your specific application. Whether we are manufacturing probes for the budget-conscious shopper or high-end performance applications, meeting a high standard of quality is priority to us. Our dedication to manufacturing probes, coupled with our expertise in AFM, ensures that we are unique…

The ForceRobot ® 400 BioAFM incorporates a number of unique force spectroscopy innovations to measure forces at the single-molecule level. As forces play a crucial role in molecular mechanisms, such as recognition and signaling, this BioAFM is uniquely suited for emerging life science research. It enables the quantification of the mechanical strength of individual molecular bonds and the characterization of the force-dependen…