Products & Reviews

World's Ultimate AFM The new benchmark for speed with highest resolution and performanceThe Dimension FastScan™ delivers, for the first time, extreme imaging speed without loss of resolution, loss of force control, added complexity, or additional operating costs.This tip-scanning system provides measurements on both large and small size samples in air or fluids. With the FastScan you can achieve immediate atomic force microsc…

Bringing new levels of performance, functionality, and AFM accessibility to nanoscale researchers. The Dimension Icon® Atomic Force Microscope brings new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. The culmination of decades of large-sample AFM technology, the system has been designed from top to bottom to deliver revolutionary low drift and low noise that allo…

A new chapter in High-Speed AFM: Molecular dynamics in real-time at 50 frames per second

Versatile nanomechanical test instrument for advanced material characterization

The nanoIR3 is the latest generation nanoscale IR spectroscopy, chemical imaging, and property mapping system for both materials and life science applications. The system also provides IR-based chemical imaging to provide mapping of chemical variations of the feature of interest. Unique point spectroscopy capabilities provide both spectroscopy and chemical imaging with a single source.

Atomic Force Microscopy for Patterned Sapphire Substrates Delivering advanced automated metrology and production capabilities with superior resolution for now and the future. Bruker's Dimension Edge™ PSS Atomic Force Microscope with AutoMET™ Metrology Analysis Software is the ideal nano-metrology and nano-inspection system for LED substrate and epitaxial manufacturers. As an extension of the Dimension Edge AFM platform, the Ed…

The benchmark for High-Performance Atomic Force Microscopy. It provides high resolution imaging, complete quantitative nanoscale data and is surprisingly simple to operate.

Unprecedented quantitative characterization of materials on the nanoscale PeakForce QNM® (Quantitative Nanomechanical Property Mapping) allows quantitative nanomechanical mapping of material properties, including modulus and adhesion, while simultaneously imaging sample topography at high resolution. PeakForce QNM and its counterpart mode PeakForce Mapping are based on Bruker's exclusive PeakForce Tapping® technology, which re…

Bruker’s Dimension Icon brings the highest levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world’s most utilized large-sample AFM platform, it is the culmination of decades of technological innovation, customer feedback, and industry-leading application flexibility. 

The JPK NanoWizard V ® combines high spatio-temporal resolution with a large scan area, flexible experiment design, and out-standing integration with advanced optical microscope systems. The automated setup, alignment, and re-adjustment of system parameters open new possibilities for long-term, self-regulating experiment series.