Materials analysis examines the properties, composition, and behavior of materials at a microscopic and macroscopic level. Using advanced techniques such as microscopy, spectroscopy, and chromatography, materials analysts investigate the structure, purity, and performance of various substances. From industrial materials and nanomaterials to battery testing and beyond, this field provides critical insights into the characteristics and applications of materials across industries such as manufacturing, electronics, and healthcare. Explore how materials analysis drives innovation, quality assurance, and product development for a wide range of applications.
10, 20- and 30-Place Cardboard Slide Tray - Features thumb cut for easy slide removal Heathrow Scientific cardboard slide trays hold standard slides (75 x 25 mm and 3 x 1"). The horizontal compartments are recessed to protect the specimens when the cover is closed. Features thumb cut for easy slide removal. Now available with blue and green tape and imprinting.
20-Place Slide Tray Racks - Store multiple trays for easy retrieval Heathrow Scientific 20-Place Slide Tray Racks are ideal for Microbiology, Histology, and Pathology fields. Sturdy ABS rack holds five of the 20-place slide trays. Eliminates the worry of breakage during retrieval—easy access to each of the trays. Matching clasps provide area for identification labels and doubles as a handle. Label or write with permanent pen o…
15-, 40-, and 78-Capacity Slide Holders 15-, 40-, and 78-Capacity Slide Holders from Heathrow Scientific hold slides during evacuation, cleaning, and drying. Cut from chemical-resistant polyethylene. Solid and strong with rubber feet for benchtop stability.
MicroSAM - The new Dimension in Process Gas Chromatography MicroSAM , the newest on-line Process Gas Chromatograph from Siemens, brings a new dimension to the industry - small! Using modern silicon micro-machining techniques achieves miniature size while simultaneously increasing power and versatility. The explosion-proof enclosure contains everything you need for separation and detection of the measured sample integrated into…
108 Auto Sputter Coater - ideal for routine sample preparation for scanning electron microscopy The Ted Pella 108 Auto Sputter Coater is ideally suited for automated high quality coating of non-conducting samples for standard SEM imaging. The added functionality of the automatic features enable fine grain coating on a range of samples with a choice of target materials. The automatic purge and leak functions together with the o…
CCS-2100 Automatic Cold-Cranking Simulator • Cooled by Built-in Solid-State Thermoelectric Modules • Improved Precision Over Earlier Models • Powerful VISCPRO® for Windows® Software • Fully Automatic Operation • Extended Range – 900 to 25,000 mPa·s (cP) • Needs No Solvent Cleaning CANNON Thermoelectrically-Cooled Cold-Cranking Simulators measure the apparent viscosity of oils at temperatures from –35°C to –5°C within a viscosi…
Thermo Scientific* LTQ FT Ultra combines the most advanced Ion Trap and Fourier Transform Ion Cyclotron Resonance technologies into a single instrument with unprecedented analytical power and versatility. Ultra-high resolution and sensitivity coupled with sub ppm mass accuracy, and MSn are universally available for the toughest applications demanding rigorous structural characterization.
Purospher® STAR NH2 is a high purity aminopropyl modified stationary phase.
The BV200 automated multi-sampling plasma viscometer calculates the PV of samples within 30 seconds of the tube being detected by the system. It can process up to 180 samples, displays the PV on the local PC, and automatically makes the information available to the hospital computer system. For the busy laboratory, this load-and-walk-away system saves time and eliminates many manual errors. The automated bar code facility, 't…
A “Brush-type” phase with broad applicability for separation of enantiomers: Whelk-O 1 is a reliable chiral HPLC column of high solvent stability and broad applicability. Whelk-O 1 is a “brush-type” phase according to the concept of Pirkle with (3R, 4R)-4-(3,5-dinitrobenzamido)-1,2,3,4-tetrahydrophen-anthren or (3S, 4S)-4-(3,5-dinitrobenzamido)-1,2,3,4-tetrahydrophen-anthren as chiral selector with high enantoselectivity for a…
Attocube attoMFM I - Low temperature magnetic force microscope, cantilever based The Attocube attoMFM I is a compact magnetic force microscope designed particularly for applications at low and ultra low temperature. Based on a conventional atomic force microscope, the attoMFM I instrument works by scanning the sample below a fixed magnetic cantilever. The magnetic force gradient acting on the attoMFM I tip is then determined…
Attocube attoSHPM - Low temperature scanning Hall probe microscope The attoSHPM is a compact scanning Hall probe microscope, designed particularly for operation at low temperature and high magnetic fields. At the heart of the SHPM, a molecular beam epitaxy (MBE) grown GaAs/AlGaAs Hall sensor measures magnetic fields with unrivalled sensitivity. Local measurements of the magnetization of a sample are obtained by scanning the…
Attocube attoFPSensor - Long range, high precision, ultra compact interferometric displacement sensor The attoFPSensor is based on a Fabry Perot interferometer consisting of a single mode fiber and a sensing element. The compact design (6 mm long, 3 mm diameter) and the attocube-typical compatibility with extreme environments such as ultra high vacuum und very low temperature open up new possibilities and applications for int…
Attocube Systems Atomic Force Microscopes (AFMs) are designed as complete system solutions, capable of being integrated into virtually any electron microscope currently on the market. The Attocube Systems AFMs offer highest levels of usability and flexibility, enabling scientists to perform high-precision measurements in material science, structural biology, solid state physics, and other fields of nanotechnology. attocube s…
Attocube ASC500 - Scanning Probe Microscope Controller The Attocube Systems ASC500 is a modular and flexible digital SPM controller which combines state-of-the-art hardware with innovative software architecture, offering superior performance and unprecedented variety of control concepts. The Attocube ASC500 SPM controller was developed with the goal to never be the limiting factor in any SPM experiment. All desirable functions…
Attocube Systems ANPx101/RES The ANPx101/RES linear, horizontal stepper positioner with resistive position readout allows for absolute positioning control. This readout solution can be delivered compatible with low temperatures, ultra high vacuum and magnetic fields. Key Features of the Attocube Systems ANPx101/RES: environments LT; UHV; magnetic field closed loop resolution: ~ 200 nm motion linear stepping & scanning travel…
Attocube Systems ANPx101/NUM PositionerThe ANPx101/NUM Positioner with an optoelectronic encoder allows for ultra precise, closed loop positioning control. This readout solution can be delivered compatible with ultra high vacuum. Key Features of the Attocube Systems ANPx101/NUM Environments UHV Closed loop resolution: 10 nm Motion linear stepping & scanning Travel 5 mm Resolution sub nm Size 24 x 28 x 14.5 mm Load 100 g Encod…
K-TEK Nanotechnology NSG01 - AFM Mode: Non Contact, Semi Contact ProbeThis versatile AFM-mode non-contact probe from K-TEK Nano provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory. Available Options with the NSG01AFM-mode non-contact probe:…
K-TEK Nano NSG03 AFM Mode: Non Contact, Semi Contact Probe This versatile AFM mode non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this NSG03 noncontact probe a must have for any AFM laboratory. Available Options with the K-TEK NSG03 AFM Mode Non Contact Pr…
K-TEK NSG10 AFM Mode: Non Contact, Semi Contact Probe This versatile non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory. Available Options with the K-TEK NSG10 non-contact AFM probe: -PtIr, TiN, and Au tip coatings -CoCr…
K-TEK Nano NSG20 - AFM Mode Non-Contact Probe This versatile NSG20 AFM non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory. Available Options with the NSG20 AFM non-contact probe: -PtIr, TiN, and Au tip coatings -CoCr mag…
K-TEK NSG30 - AFM Mode Non-Contact, Semi Contact Probe This versatile NSG30 AFM non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory. Available Options with the K-TEK NSG30 AFM Non-Contact Probe: -PtIr, TiN, and Au tip coa…
K-TEK Nano FMG01 AFM Mode Non-Contact Force Modulation Probe This versatile FMG01 AFM non-contact probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory. Available Options with the FMG01 AFM Mode Non-Contact Force Modulation Probe: -PtI…
K-TEK CSG01 AFM Mode Contact Probe This versatile CSG01 AFM Mode Contact Probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory. Available Options with the CSG01 AFM Mode Contact Probe: -PtIr, TiN, and Au tip coatings -CoCr magnetic ti…
K-TEK CSG10 AFM Mode Contact Probe This versatile CSG10 AFM Mode Contact Probe provides its users with a tetrahedral tip design which allows for greater consistency in terms of quality and sharpness (typical 6nm). Standard Au backside coating and various customizable options make this a must have for any AFM laboratory. Available Options with the CSG10 AFM Mode Contact Probe: -PtIr, TiN, and Au tip coatings -CoCr magnetic tip…
