Electron Microscopy Products & Reviews

Atomic Resolution S/TEM

200kV Monochromated S/TEM

Field Emission EPMA

LaB6 EPMA

Focused Ion Beam Milling & Imaging System

Direct Write E-beam Lithography System

Direct Write E-beam Lithography System

E-Beam Mask/Reticle Writer

Atomic Resolution TEM

Field Emission Cryo-electron Microscope

High-throughput Analytical S/TEM

Scanning Electron Microscope with exceptional fidelity at any kV

Ion Beam Cross Section Polisher (CP) 

Field Emission Auger Microprobe

Multibeam System

The JEOL JEM-1400 series 120kV Transmission Electron Microscope is widely accepted for its ease of use and high resolution imaging and analysis. Applications include pathology, biology, quality control, nanotechnology, polymer, and materials development.

Cutting Edge in FIB sample preparation, imaging and analysis

Segmentation of subcellular structures from 3-dimensional electron microscopy (EM) data

AZtecLive and Ultim™ Max (Silicon Drift Detector) for EDS analysis, combine live electron images with live X-ray chemical imaging to allow a revolutionary change in how users investigate their samples in the SEM.

AZtecTEM, powered by Ultim™ Max (Silicon Drift Detector), provides exceptional elemental characterisation abilities in the TEM.

Xplore is the next generation of EDS detector for routine analysis in the SEM.

The Symmetry S3 is the only genuine all-in-one EBSD detector on the market, and is based on the revolutionary Symmetry detector, the world’s first EBSD detector to utilise advanced CMOS technology.

The ORCA-Fusion, built from the sensor up, balances the complex nuances of camera features to provide beautiful images and robust data at all lights levels, but especially in tough low-light conditions.

The H-9500 is a high performance TEM featuring a single crystal LaB6 electron source. This allows 0.102 nm crystal lattice resolution and 0.18 nm point to point to be achieved. The instrument features a low magnification operating mode of x200 to x500 and a high magnification mode with zoom from x1000 to x1,500,000. Fully PC-controlled, the instrument has an icon-driven user interface and is designed for very fast operation. W…

The S-3700N features an ultra large specimen chamber and stage to allow observation of specimens at diameters up to 300mm. Hitachi Variable Pressure SEM (VP-SEM) series have been received with high reputation from customers around the world. They feature low vacuum observation method (6 – 270 Pa) which enables observation of non-conductive samples like electronic components, and water containing samples such as cultured cells,…