Electron Microscopy Products & Reviews

Your Interactive SEM for Multi-User Environments

Within ZEISS Crossbeam Family you have the choice between Crossbeam 340 or Crossbeam 550. Exploit the variable pressure capabilities of Crossbeam 340. Or use Crossbeam 550 for your most demanding characterizations and choose the chamber size, standard or large, that best suits your samples.

For Your Highest Demands in Sub-nanometer Imaging, Analytics and Sample Flexibility

A ninth generation nanomanipulator, designed for optimum performance and flexibility.

It's simplicity enables all users, even those new to Electron Microscopy (EM), to image their samples and to obtain high quality, high resolution images within minutes. No special sample preparation such as coating with metal films is required for hydrated, oily or non-conducting samples, and TM3000 is easy to use like a digital camera. The TM3000 TableTop Microscope has been developed to cover the widest range of industrial a…

The SU6600 is Hitachi's latest high resolution analytical field emission SEM with Variable Pressure technology allowing observation and analysis of any type of wet, oily or dirty sample. Advanced Schottky electron gun technology combined with our patented ADAPT, automated differential aperture system, yields greater than 200nA of current; ten times the current other manufacturers can provide with thermal emissions. The large a…

The Ultramicrotome Leica EM UC7 provides easy preparation of semi- and ultrathin sections as well as perfect, smooth surfaces of biological and industrial samples for TEM, SEM, AFM, LM examination. Expand the EM UC7 with the EM FC7 cryochamber to a state-of-the-art cryo sectioning system in just a few mins. For serial sectioning, use the ARTOS 3D ultramicrotome to get consistent, ultrathin serial sections for array tomography…

High-pressure freezing with the possibility of light and electrical stimulation

The Only Integrated SEM/EDX System Now in its third generation, the ASPEX EXplorer is a scanning electron microscope that is designed for the automated imaging and elemental analysis of a wide spectrum of surfaces and particulate. A unique blend of hardware ruggedization and software sophistication creates a system platform that is readily accessible. The ASPEX EXplorer system provides a fully integrated SEM and EDX platform f…