Electron Microscopy Products & Reviews

The SU9000 Ultra High Resolution FE-SEM is Hitachi's new premium UHR FE-SEM. It features unique electron optics, with the sample positioned inside a gap of the split objective lens pole piece. This so-called true inlens concept - combined with the next generation of HITACHI's cold field emission technology - guarantees the highest possible imaging resolution (0.4nm @ 30kV, 1.2nm @ 1kV) and stability. To make this resolving pow…

Hitachi VP-SEM SU1510 - Top performance in very compact size The new Hitachi SU1510 VP-SEM combines the high-performance electron optics of the S-3400N and S-3700N with an ultra-compact design. Its main body is only 55cm wide, and unlike conventional SEM design concepts the SU1510 does not require a special display and operating console - instead, monitor and PC controls can be conveniently placed on any user prepared workspac…

The Triple Ion Beam Cutter, Leica EM TIC 3X allows production of cross sections of hard/soft, porous, heat sensitive, brittle and heterogeneous material for Scanning Electron Microscopy (SEM), Microstructure Analysis (EDS, WDS, Auger, EBSD) and, AFM investigations. 

Ensure the ultrastructures of your tissue samples can be precisely compared every time by preparing them with the EM TP tissue processor. 

Correlating Cryofixed Biological Samples in the Light- and Electron Microscope.

The Leica EM TXP is a target preparation device for milling, sawing, grinding, and polishing samples prior to examination by SEM, TEM, and LM techniques.

Developed in cooperation with leading scientists, the EM ACE coater family covers all the requirements for your sample preparation needs, from coating to freeze fracture. 

Leica's cryo-electron tomography workflow solution: boost your productivity with a seamless sample preparation workflow.

Next generation sample preparation for cryo-EM 

High-resolution STEM imaging The Model 3000 Annular Dark Field (ADF) Detector is ideal for high-resolution scanning transmission electron microscopy (STEM) imaging. It allows simultaneous high angle ADF imaging and electron energy less spectroscopy (EELS). It has single electron detection capabilities and high quantum efficiency. The detector is pneumatically retractable from the beam path. Atomic-resolution imaging and Z-cont…

Provides clean environment for SEM The Cryo-Can provides a clean environment for SEM sample imaging and analysis. It helps eliminate chamber contamination resulting from sample outgassing and other sources. The Cryo-Can improves both imaging and analytical data quality. It is ideal for high beam current applications. Uses SEM vacuum system The Cryo-Can vacuum container is readily connected to one of the SEM chamber ports and d…

Revolutionary ultra-low-energy, concentrated ion beam Fischione’s Model 1040 NanoMill® TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy (TEM) imaging and analysis. It is ideal for both post-FIB (focused ion beam) processing and the enhancement of conventionally prepared specimens. Targeted, ultra-low-energy NanoMillingsm proce…

High-quality thin foils for TEM Electrolytic thinning of conductive materials is an effective method of quickly producing specimens for transmission electron microscopy (TEM) without any induced artifacts. In the Model 110 Twin-Jet Electropolisher, twin jets simultaneously polish both sides of the sample, creating electron transparent specimens within a few minutes. The Electropolisher features easily adjustable electrolyte fl…

AZtecEnergy will change the way you collect, process and view EDS data. Whether novice or expect, you’ll gather more accurate results, see everything in stunning high resolution, and finish the job faster than ever. Building on over 40 years experience and the feedback from the world’s largest microanalysis user community, AZtec is everything you’d expect of an Oxford Instruments system. Only better.

The PELCO® STEM imaging holder enables STEM imaging in the SEM by using the standard Everhart-Thornley SE detector in the SEM chamber. The standard 3mm TEM grid is placed in the grid holder and located under the scanning beam. The STEM image is created by the adjustable Pt conversion plate which must face the chamber SE-detector. Cost-effective method for STEM imaging by using the existing SE detector in the SEM chamber. The i…

Thermo Scientific QuasOr, the no compromise EBSD. Electron Backscatter Diffraction (EBSD) enables nanostructural analysis in the electron microscope by characterizing the crystalline structures which affect physical properties in a wide range of materials. As an integral part of the Thermo Scientific NORAN System 7, simultaneous acquisition of EBSD and EDS/WDS spectral images are performed with ease.

The ONE camera to capture 16 MP images and video in all your TEM applications.

Automate sectioning and image capture of your 3D ultrastructure using serial block-face scanning electron microscopy.

Ideal for low energy surface preparation for your SEM cross section viewing.

Murano stage available for heating to 950 °C for EBSD applications and 1250 °C for secondary electron detector (SED) imaging.

The CLUE (Cathodo-Luminescence Universal Extension) series is designed for use in materials science, mineralogy, geology, life sciences and forensics applications. They interface with any Scanning Electron Microscopes (SEM) and dual SEM/Focused Ion Beam (FIB) microscopes, are fully automated, modular for easy upgrade and offer the widest spectral range available (UV-Vis-IR).  

The new Thermo Scientific™ Glacios™ Cryo Transmission Electron Microscope (Cryo-TEM) delivers a complete and affordable Cryo-EM solution to a broad range of scientists.

This 4th generation Neoscope incorporates advanced technology and functions that make it simple for users at any skill level to obtain outstanding SEM images and elemental analysis results in minutes.  It is equipped with a large chamber, high and low vacuum modes, secondary and backscatter electron detectors, real-time 3D imaging, highly-advanced auto functions and the option to add a fully embedded EDS with real-time, ‘Live’…

The Thermo Scientific Krios G4 Cryo-Transmission Electron Microscope (Cryo-TEM) is a compact TEM. The instrument can be installed in labs with a ceiling height below 3.04 m (~10 ft), as the microscope height it below 3 meters. The Krios G4 Cryo-TEM has improved ergonomics for easier sample exchange. Data acquisition set up is easier and faster thanks to enhanced automation, systematic user guidance and advanced performance mo…

Improve speed and quality in cryo-TEM sample preparation with Vitrobot™