Electron Microscopy Products & Reviews

For the Highest Demands in Imaging and Analytics from Any Sample

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RISE Microscopy is a novel correlative microscopy technique that combines SEM and confocal Raman Imaging and links ultra-structural surface properties to molecular compound information. RISE Microscopy combines an SEM and a confocal Raman microscope. The confocal Raman microscope is integrated into the vacuum chamber of the electron microscope. Non-destructive Raman and SEM measurements are consecutively performed at two diff…

Ultim Extreme Silicon Drift Detector is a breakthrough solution for ultra high resolution FEG-SEM applications and delivers solutions beyond conventional micro- and nano-analysis.

Combining the X-ray peak resolution power of WDS with the speed of EDS, AZtecWave is a software solution that allows users with all levels of expertise to quantify minor and trace elements with ease.

The S-3400N is the World Class Variable Pressure SEM The S-3400N offers advances in automation including full filament saturation and “no touch” objective aperture alignment. The New Analytical Chamber Provides • Segment, Ultra Thin, Backscattered Electron Detector Capable of TV Rate Observation • Fully Automated with One Button Automatic "No Touch" Objective Aperture Alignment • Turbo Molecular Pump (TMP) Provides a Fast and…

The SU3500 Scanning Electron Microscope features innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance. Designed with intuitive logic, the new user-friendly GUI provides comprehensive image observation and display functions. Engineered for a wide range of applications, including biological specimens and advanced materials, the SU3500 is sure to be the workhorse micros…

The SU8000 Series is Hitachi's latest product family of ultra-high performance, semi-in-lens SEM with cold-field emission. The series was developed in response to the growing demand for robust, affordable SEM application solutions. Image performance in this series is optimized with the latest generation of Hitachi's patented super ExB in-lens detection for energy filtering, charge suppression, and contrast control; affording u…

Ultra-high Resolution Scanning Electron Microscope SU8200 Series - Innovative Cold Field Emission Gun with Unmatched Resolution and Beam Stability This novel CFE gun employs a Hitachi patented "Mild flashing" technique and a new vacuum system which greatly minimizes gas molecule deposition on the emitter tip. The emitter always operates in a "clean" state, and emission current and beam stability are significantly improved. The…

The TM3030/TM3030Plus are equipped with premium signal detectors which have been incorporated in FE-SEM and VP-SEM and provide unparalleled image quality.