An introduction to AFM-based scanning electrochemical microscopy: PeakForce SECM

In this application note from Bruker, explore the PeakForce SECM™, a complete commercial solution for atomic force microscopy (AFM)-based scanning electrochemical microscopy. With a spatial resolution less than 100 nm, PeakForce SECM provides simultaneous capture of topographical, electrochemical, electrical, and mechanical maps with nanoscale lateral resolution. A number of applications are detailed that showcase how the PeakForce SECM capability is helping enable multidisciplinary research in a wide arena of markets.