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MultiMode 8-HR

The benchmark for High-Performance Atomic Force Microscopy. It provides high resolution imaging, complete quantitative nanoscale data and is surprisingly simple to operate.

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Bruker Nano Surfaces and Metrology

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Average Rating 4.2

|3Scientists have reviewed this product

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Fairly satisfactory but time-consuming to get good images.

 

Average Rating 4.0

Application Area:

Adsorption of nanomaterials

AFM is sophisticated but Bruker's MultiMode 8 is decent in terms of handling. I wish there were faster ways to calibrate the laser especially positioning it on top of the tip or finding the laser on sample surface. Scans are also time consuming. But, if everything is done correctly, one can get high resolution images.

Review Date: 4 Mar 2020 | Bruker Nano Surfaces and Metrology

Multi-mode AFM.

 

Average Rating 4.7

Application Area:

Scanning microscopy

I enjoyed working with the multi-mode AFM. The system was very easy to use. The best part about the system was that technical support was very knowledgable and helped me whenever I needed assistance. I was able to switch between AFM and STM mode with relative ease.

Review Date: 26 Mar 2019 | Bruker Nano Surfaces and Metrology

Good product, help feature could use an update.

 

Average Rating 4.0

Application Area:

Nanomechanical property determination

Very useful software system and accurate analysis. Help feature could be updated to accurately reflect the current software system.

Review Date: 26 Mar 2019 | Bruker Nano Surfaces and Metrology

The benchmark for High-Performance Atomic Force Microscopy. It provides high resolution imaging, complete quantitative nanoscale data and is surprisingly simple to operate.

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