ArBlade 5000 – An innovative, high-performance sample preparation tool for SEM

Often, conventional mechanical sample preparation techniques for scanning electron microscopy (SEM) can deliver usable results on some specimens. However, they can also fail, especially when it comes to composites and layered structures with different hardness, brittle materials, and so forth. Explore the power of broad ion beam milling methods and how the Hitachi ArBlade 5000 – a broad ion beam system – produces exceptionally high-quality cross-section or flat-milling samples for electron microscopy.