Beyond the naked eye: Characterizing nanomaterials with precision

As the demand for faster, smaller, and more cost-effective electronics remains high, so does the need for researchers to innovate and develop novel solutions that deliver superior performance, speed, and reliability. These innovations are driving the development of new and exciting technologies, and part of this change is the ability for users to characterize materials with more precision than ever before.

This eBook presents some of the most advanced material characterization technologies on the market. Discover how to investigate the microscopic world using 3D X-ray imaging, and how to fully characterize powders. The guide also highlights the future of high-throughput imaging using focused ion beam-scanning electron microscopy (FIB-SEM) systems.

Download the eBook free today to:

• Find out more about optimizing sample preparation
• Learn how to obtain crystallographic information using diffraction contrast tomography
• Explore the latest cutting-edge technologies designed to support both academic researchers and industries in materials science, including X-ray microscopy (XRM) tools