Characterization of the Polymer Blend PMMA-SBR: Combining Confocal Raman and Atomic Force Microscopy

Characterization of heterogeneous systems on the nanometer scale continues to grow in importance and to impact key applications in the field of materials science, nanotechnology and catalysis. Certain properties, however, are difficult to study with conventional characterization techniques due to the inability of these methods to chemically differentiate materials with sufficient spatial resolution, without damage, staining or preferential solvent washing. This application note demonstrates how a combination of confocal, raman and atomic force microscopy can be used to overcome such limitations.