Characterizing polymers using correlative RISE microscopy

Many polymers are challenging to understand because of their complex structures. Traditional characterization methods often imply time-consuming sample preparation and are limited in terms of revealing fine structural details. ZEISS presents an optimal solution for characterizing polymers and illustrates how correlative Raman imaging scanning electron microscopy (RISE) can be used to analyze aging of battery separators, identify polymers in blends, and improve the quality of paper. It shows how the RISE integrated system provides a user-friendly correlative workflow and offers the capability to do analysis beyond energy-dispersive X-ray spectroscopy (EDS) via vibrational spectroscopy, while being fully integrated into an SEM.