ContourX 3D optical profilometers

In this application note, Bruker Nano provides a detailed overview of its range of benchtop profilometers. The ContourX suite of benchtop profilometers features the latest measurement hardware and analysis advances to provide gage-capable, quantitative 3D surface characterization for an extremely wide range of surfaces, from rough to smooth, bright to dark, transparent to opaque, or otherwise difficult to measure. With the available choice of configurations, analytical options, objectives, and measurement modes, ContourX has been designed to meet the needs of virtually any challenging surface metrology application.