ContourX-500
The ContourX-500 Optical Profilometer is the world’s most comprehensive automated benchtop system for fast, non-contact 3D surface metrology. The gage-capable ContourX-500 boasts unmatched Z-axis resolution and accuracy, and is easily customized for the widest range of complex applications, from QA/QC metrology of precision machined surfaces and semiconductor processes to R&D characterization for ophthalmics and MEMS devices.…
ContourX-500 optical profilometer
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Full-featured optical profiler with advanced automation and tip/tilt head.
ContourX benchtop profilometers combine four decades of Wyko and Bruker technological advances to achieve industry-leading capability and utmost customer satisfaction with:
- Most optimized WLI technology for surface metrology
- Unmatched vertical resolution over large field of view
- Fastest time to results with uncompromised precision and accuracy
- Best-in-class reliability and repeatability
