Explore Bruker’s Dimension Icon atomic force microscope

In this application note, explore Bruker’s Dimension Icon^® Atomic Force Microscope (AFM) System which offers new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. This system has been designed from top to bottom to deliver the revolutionary low drift and low noise that allows users to achieve artifact-free images in minutes instead of hours. Icon is also fully optimized with proprietary PeakForce Tapping^® technology and ScanAsyst^® automatic image optimization technology, which enables easier, faster, and more consistent results, regardless of user skill level.