Dimension Icon

Bruker’s Dimension Icon^® Atomic Force Microscope (AFM) System introduces new levels of performance, functionality, and AFM Dimension Icon is the most productive large-sample AFM in the world.

Bruker’s Dimension Icon Atomic Force Microscope (AFM) System introduces new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. As the world’s most utilized large-sample AFM platform, the Dimension Icon is the culmination of decades of technological innovation, customer feedback, and industry-leading application flexibility. The system has been designed from top to bottom to deliver the revolutionary low drift and low noise that allows users to achieve artifact-free images
in minutes instead of hours. Icon also is fully optimized with proprietary PeakForce Tapping technology and ScanAsyst automatic image optimization technology, which enable easier, faster, and more consistent results, regardless of user skill level. Highest level AFM research with radical productivity gains has never been easier to achieve.

Dimension Icon is Bruker’s best-selling AFM for a host of reasons:

• Highest performance closed-loop tip scanning delivers unmatched large-sample resolution with open-loop noise levels, reduced noise floor, and <200 pm drift rates.
• Hardware and software optimized for productivity provides surprisingly simple setup, intuitive workflow, and fast time to results for publication-quality data every time.
• Open-access platform delivers unprecedented versatility to accommodate the widest variety of experiments, modes, techniques and semi-automated measurements.