Graphene characterization with Raman spectroscopy

Graphene’s remarkable electron transport properties, extreme mechanical strength, and high thermal conductivity make it revolutionary for next-generation nanoelectronic devices. With electronic mobilities exceeding 15,000 cm²V⁻¹s⁻¹ and a strength over 200 times that of steel, graphene is poised to play a key role in the future of ultrafast transistors, microcircuits, and computer chips.

However, accurately characterizing graphene — distinguishing layer numbers, assessing disorder, and understanding structural integrity — is crucial for its practical applications. Raman micro-spectroscopy has emerged as an essential tool for graphene research, offering:

• Non-destructive, high-resolution analysis of graphene’s structural properties
• Rapid and reliable identification of layer number and disorder impact
• Precise spectral and spatial resolution for material characterization
• A standard method for graphene-based device development

Explore how Raman spectroscopy enables fast, accurate, and reproducible graphene analysis, accelerating innovation in nanoelectronics.