High-resolution characterization of solid foams

Characterization of the 3D morphology of solid foams is extremely important but has been limited due to the shortcomings of conventional techniques. High-resolution techniques such as physical sectioning coupled with optical or electron microscopy are not only destructive and time-intensive, but can also introduce physical artifacts. ZEISS highlights how the ZEISS Xradia Versa and the ZEISS Xradia Ultra series of 3D X-ray microscopes provide a unique solution for non-destructive submicron resolution and the highest contrast in foam imaging that can be achieved. Foam structures can be imaged to submicron spatial resolutions: down to 500 nm on ZEISS Xradia Versa and 50 nanometers on ZEISS Xradia Ultra.