Identify, access, prepare and analyze with precise navigational guidance

Advanced materials research is challenging, as material scientists need to understand structures, properties and processes across different length scales within a material. This requires a range of imaging and analysis technologies that enable them to understand materials from macro-to-sub-nanometer scales. Following the move from the macro-scale to sub-nanometer, a workflow that enables scientists to make the best decisions possible for the best experimental outcomes is needed.

In this application note, ZEISS details its Sample-in-Volume Analysis workflow that aims to provide navigational guidance to characterize samples within a large volume in order to present multi-scale and multi-modality experimental findings.