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Investigating the origin of the domain structure in the piezoresponse of hybrid perovskites

8 Sept 2021

In this application note, Park Systems demonstrates how the characterization and classification of ferroelectric domains can be achieved using resonance enhanced Piezoelectric Force Microscopy (PFM) on a Park Systems NX10 Atomic Force Microscope (AFM) with a Zurich Instruments HF2 Lock In Amplifier.

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