Novel Optical Design of Field Emission SEMs

Innovations in Gemini column, detection technology and variable pressure technology

16 Nov 2020

Field emission scanning electron microscopy is standard technology for high resolution imaging and different contrasting methods aiming for a comprehensive characterization of specimens. A wide range of applications is covered by classical FE-SEM technology, including imaging surface sensitive and non-conductive samples without pre-treatment. This application note demonstrates the utility of Zeiss' Gemini technology in advanced imaging applications.

Links

Tags