Performing hyperspectral mapping with AFM DataCube nanoelectrical modes

Atomic force microscopy (AFM)-based nanoelectrical modes have found applications in fields ranging from semiconductors to piezoelectric materials, energy research, and biology. Modes are available to characterize the local conductivity, resistivity, charge, carrier concentration, carrier-type, or piezoelectric properties with nanometer-scale spatial resolution, and usually require direct contact between the AFM tip and sample. In this application note, explore a new approach to nanoelectrical imaging that goes beyond a 2D map.