sciTEM - High-Throughput Characterization of Nanoparticles by SEM/TEM

Analysis of nanoparticles by TEM is a very useful characterization method. However, by design, TEM instruments place sample grids under high vacuum. Having the capability to insert multiple samples at once inside the TEM and then acquiring all images without breaking vacuum for each one, results in a significant increase in the number of samples that can be analyzed per measurement cycle. This note describes the application of a well-proven technology for dispensing multiple liquid samples as colloidal suspension of nanoparticles onto a single TEM support grid. The technology can also be applied to related methods such as SEM.