Stabilizing the piezoresponse for accurate and crosstalk-free ferroelectric domain characterization via dual-frequency resonance tracking

In this application note, Park Systems images ferroelectric domains of a bismuth ferrite (BFO) film with resonance-enhanced piezoelectric force microscopy (PFM) on a Park Systems NX10 Atomic Force Microscope (AFM) with a Zurich Instruments HF2 lock-in amplifier (LIA).