Targeted sample preparation with Zeiss crossbeam laser

In this application note, ZEISS details the laser registration procedure for precise sample preparation using the Crossbeam laser. Various factors limit the laser targeting accuracy, but it can be experimentally determined and corrected using the local offset correction method. ZEISS states that after the first correction, accuracy improves by a factor of three, and a second iteration can improve it to less than 2 μm. This level of accuracy enables efficient site-specific sample preparation workflows, as demonstrated in the example of LEAP sample preparation.